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IMAGES

FEI Model 6000 Focused Ion Beam Workstation

Zeiss Model 960 Analytical Scanning Electron Microscope

Hitachi Model H800 Analytical Transmission Electron/Scanning Transmission Electron Microscope

JEOL Model 2000fx Analytical Transmission Electron/Scanning Transmission Electron Microscope

Optical Metallography

MOVIES

JEOL Model 2000fx 

In-Situ Heating - Straining Stage (SEM)

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